A comprehensive model for hot carrier degradation in LDMOS transistors

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Authors
Moens, P.; Mertens, Jan; Bauwens, F.; Joris, P.; De Ceuninck, Ward; Tack, M.
Conference
Proceedings 45th Annual IEEE International Reliability Physics Symposium
Title
A comprehensive model for hot carrier degradation in LDMOS transistors
Publication type
Proceedings paper
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