Browsing by author "Tio Castro, David"
Now showing items 1-6 of 6
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Degradation of the reset switching during endurance testing of a phase-change line cell
Goux, Ludovic; Tio Castro, David; Hurkx, Fred; Lisoni, Judit; Delhougne, Romain; Gravesteijn, Dirk; Attenborough, Karen; Wouters, Dirk (2009) -
Electromigration study of sub-100nm Cu-lines
Michelon, Julien; Bruynseraede, Christophe; Tio Castro, David; Roussel, Philippe; Hoofman, Romano; Maex, Karen (2005) -
Evidence of the prominent role of the time-under-melt parameter in the reset switching of phase-change line cells
Goux, Ludovic; Gille, Thomas; Tio Castro, David; Hurkx, Fred; Lisoni, Judit; Delhougne, Romain; Gravesteijn, Dirk; De Meyer, Kristin; Attenborough, Karen; Wouters, Dirk (2008) -
Evidence of the thermo-electric Thomson effect and influence on the program conditions and cell optimization in phase-change memory cells
Tio Castro, David; Goux, Ludovic; Hurkx, G.A.M.; Attenborough, Karen; Delhougne, Romain; Lisoni, Judit; Jedema, F.J.; in 't Zandt, M.A.A.; Wolters, R.A.M.; Gravesteijn, Dirk; Verheijen, M.A.; Kaiser, M.A.; Weemaes, R.G.R.; Wouters, Dirk (2007) -
Transient characteristics of the reset programming of a phase-change line cell and the effect of the reset parameters on the obtained state
Goux, Ludovic; Gille, Thomas; Tio Castro, David; Hurkx, Fred; Lisoni, Judit; Delhougne, Romain; Gravesteijn, Dirk J.; De Meyer, Kristin; Attenborough, Karen; Wouters, Dirk (2009) -
Void growth modeling upon electromigration stressing in single damascene cu lines
Tio Castro, David; Hoofman, Romano; Michelon, Julien; Bruynseraede, Christophe (2007)