Authors

Goux, Ludovic; Gille, Thomas; Tio Castro, David; Hurkx, Fred; Lisoni, Judit; Delhougne, Romain; Gravesteijn, Dirk; De Meyer, Kristin; Attenborough, Karen; Wouters, Dirk

Conference

Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - NVSMW/ICMTD

Title

Evidence of the prominent role of the time-under-melt parameter in the reset switching of phase-change line cells

Publication type

Proceedings paper