Publication:

Electromigration study of sub-100nm Cu-lines

Date

2005

Proceedings Paper

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Author(s)

Michelon, Julien

;

Bruynseraede, Christophe

;

Tio Castro, David

;

Roussel, Philippe

;

Hoofman, Romano

;

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1965 since deposited on 2021-10-16

Acq. date: 2026-04-06