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Electromigration study of sub-100nm Cu-lines
Publication:
Electromigration study of sub-100nm Cu-lines
Date
2005
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Michelon, Julien
;
Bruynseraede, Christophe
;
Tio Castro, David
;
Roussel, Philippe
;
Hoofman, Romano
;
Maex, Karen
Journal
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1960
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1960
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations