Browsing by author "Bychikhin, S."
Now showing items 1-2 of 2
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HBM ESD robustness of GaN-on-Si Schottky diodes
Chen, Shih-Hung; Griffoni, Alessio; Srivastava, Puneet; Linten, Dimitri; Thijs, Steven; Scholz, Mirko; Marcon, Denis; Gallerano, A.; Lafonteese, D.; Concannon, A.; Vashchenko, V.A.; Hopper, P.; Bychikhin, S.; Pogany, D.; Van Hove, Marleen; Decoutere, Stefaan; Groeseneken, Guido (2012) -
IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors
Marko, P.; Meneghini, M.; Bychikhin, S.; Marcon, Denis; Meneghesso, G.; Zanoni, E.; Pogany, D. (2012)