Authors

Marko, P.; Meneghini, M.; Bychikhin, S.; Marcon, Denis; Meneghesso, G.; Zanoni, E.; Pogany, D.

ISSN

0026-2714

Issue

9_10

Journal

Microelectronics Reliability

Volume

52

Title

IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors

Publication type

Journal article

Embargo date

9999-12-31