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Articles
IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors
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IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors
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Date
2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marko, P.
;
Meneghini, M.
;
Bychikhin, S.
;
Marcon, Denis
;
Meneghesso, G.
;
Zanoni, E.
;
Pogany, D.
Journal
Microelectronics Reliability
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1962
since deposited on 2021-10-20
Acq. date: 2025-12-10
Citations
Metrics
Views
1962
since deposited on 2021-10-20
Acq. date: 2025-12-10
Citations