Browsing by author "Ghibaudo, Gérard"
Now showing items 1-2 of 2
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Mobility analysis of surface roughness scattering in FinFET devices
Lee, Jae Woo; Jang, Doyoung; Mouis, Mireille; Kim, Gyu Tae; Chiarella, Thomas; Hoffmann, Thomas Y.; Ghibaudo, Gérard (2011) -
Statistical characterization and modeling of drain current local and global variability in 14nm FinFETs
Karatsori, T.; Theodorou, C.; Lavieville, R.; Chiarella, Thomas; Mitard, Jerome; Horiguchi, Naoto; Dimitriadis, C.A; Ghibaudo, Gérard (2017)