Statistical characterization and modeling of drain current local and global variability in 14nm FinFETs

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Author(s)

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Chiarella, Thomas

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Horiguchi, Naoto

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Dimitriadis, C.A

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Ghibaudo, Gérard

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1815 since deposited on 2021-10-24

Acq. date: 2025-10-27