Authors

Karatsori, T.; Theodorou, C.; Lavieville, R.; Chiarella, Thomas; Mitard, Jerome; Horiguchi, Naoto; Dimitriadis, C.A; Ghibaudo, Gérard

Conference

International Conference of Microelectronic Test Structures - ICMTS

Title

Statistical characterization and modeling of drain current local and global variability in 14nm FinFETs

Publication type

Proceedings paper