Browsing by author "Vanhoucke, T."

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Impact of lateral and vertical scaling on the reliability of a low-complexity 200 GHz SiGe: CHBT

Piontek, Andreas; Choi, Li Jen; Van Huylenbroeck, Stefaan; Vanhoucke, T.; Hijzen, E.; Decoutere, Stefaan (2005)
Influence of lateral device scaling and airgap deep trench isolation on reliability performance of 200GHz SiGe:C HBTs

Piontek, Andreas; Vanhoucke, T.; Van Huylenbroeck, Stefaan; Choi, Li Jen; Hurkx, G.A.M.; Hijzen, E.; Decoutere, Stefaan (2007)