Authors

Piontek, Andreas; Choi, Li Jen; Van Huylenbroeck, Stefaan; Vanhoucke, T.; Hijzen, E.; Decoutere, Stefaan

Conference

Proceedings 4th International Conference on Silicon Epitaxy and Heterosctructures - ICSI-4

Title

Impact of lateral and vertical scaling on the reliability of a low-complexity 200 GHz SiGe: CHBT

Publication type

Proceedings paper