Publication:
Impact of lateral and vertical scaling on the reliability of a low-complexity 200 GHz SiGe: CHBT
Date
| dc.contributor.author | Piontek, Andreas | |
| dc.contributor.author | Choi, Li Jen | |
| dc.contributor.author | Van Huylenbroeck, Stefaan | |
| dc.contributor.author | Vanhoucke, T. | |
| dc.contributor.author | Hijzen, E. | |
| dc.contributor.author | Decoutere, Stefaan | |
| dc.contributor.imecauthor | Van Huylenbroeck, Stefaan | |
| dc.contributor.imecauthor | Decoutere, Stefaan | |
| dc.contributor.orcidimec | Van Huylenbroeck, Stefaan::0000-0001-9978-3575 | |
| dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
| dc.date.accessioned | 2021-10-16T04:05:27Z | |
| dc.date.available | 2021-10-16T04:05:27Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11020 | |
| dc.source.beginpage | 62 | |
| dc.source.conference | Proceedings 4th International Conference on Silicon Epitaxy and Heterosctructures - ICSI-4 | |
| dc.source.conferencedate | 23/05/2005 | |
| dc.source.conferencelocation | Hyogo Japan | |
| dc.source.endpage | 63 | |
| dc.title | Impact of lateral and vertical scaling on the reliability of a low-complexity 200 GHz SiGe: CHBT | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |