Browsing by author "Rott, Karina"
Now showing items 1-3 of 3
-
Experimental characterization of BTI defects
Kaczer, Ben; Afanasiev, Valeri; Rott, Karina; Cerbu, F.; Franco, Jacopo; Grasser, Tibor; Madia, O.; Nguyen, A. P. D.; Stesmans, Andre; Resinger, Hans; Toledano Luque, Maria; Weckx, Pieter (2013) -
Extraction of the lateral position of border traps in nanoscale MOSFETs
Illarionov, Yury; Bina, Markus; Tyaginov, Stanislav; Rott, Karina; Kaczer, Ben; Reisinger, Hans; Grasser, Tibor (2015) -
On the microscopic origin of the frequency dependence of hole trapping in pMOSFETs
Grasser, Tibor; Reisinger, Hans; Rott, Karina; Toledano Luque, Maria; Kaczer, Ben (2012-12)