Extraction of the lateral position of border traps in nanoscale MOSFETs

View/open

33147.pdf (2.661Mb)

Metadata

Show full item record

Authors

Illarionov, Yury; Bina, Markus; Tyaginov, Stanislav; Rott, Karina; Kaczer, Ben; Reisinger, Hans; Grasser, Tibor

ISSN

0018-9383

Issue

9

Journal

IEEE Transactions on Electron Devices

Volume

62

Title

Extraction of the lateral position of border traps in nanoscale MOSFETs

Publication type

Journal article

Embargo date

9999-12-31

Collections

Articles