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Extraction of the lateral position of border traps in nanoscale MOSFETs
Publication:
Extraction of the lateral position of border traps in nanoscale MOSFETs
Date
2015
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Illarionov, Yury
;
Bina, Markus
;
Tyaginov, Stanislav
;
Rott, Karina
;
Kaczer, Ben
;
Reisinger, Hans
;
Grasser, Tibor
Journal
IEEE Transactions on Electron Devices
Abstract
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Views
1965
since deposited on 2021-10-22
Acq. date: 2025-10-27
Citations
Metrics
Views
1965
since deposited on 2021-10-22
Acq. date: 2025-10-27
Citations