On the microscopic origin of the frequency dependence of hole trapping in pMOSFETs

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Authors
Grasser, Tibor; Reisinger, Hans; Rott, Karina; Toledano Luque, Maria; Kaczer, Ben
Conference
International Electron Devices Meeting - IEDM
Title
On the microscopic origin of the frequency dependence of hole trapping in pMOSFETs
Publication type
Proceedings paper
Embargo date
9999-12-31
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