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On the microscopic origin of the frequency dependence of hole trapping in pMOSFETs
Publication:
On the microscopic origin of the frequency dependence of hole trapping in pMOSFETs
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Date
2012-12
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Grasser, Tibor
;
Reisinger, Hans
;
Rott, Karina
;
Toledano Luque, Maria
;
Kaczer, Ben
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1900
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Acq. date: 2025-12-11
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Views
1900
since deposited on 2021-10-20
2
last month
Acq. date: 2025-12-11
Citations