Browsing by author "jiang, Rong"
Now showing items 1-2 of 2
-
Gate bias and length dependences of total-ionizing-dose effects in InGaAs FinFETs on bulk Si
Zhao, Simeng; jiang, Rong; Wang, Pang; Zhang, En Xia; Waldron, Niamh; Kunert, Bernadette; Mitard, Jerome; Collaert, Nadine; Soncke, Sonja; Linten, Dimitri; Schrimpf, Ronald; Reed, Robert; Fleetwood, Daniel (2018-09) -
Low-frequency Noise and Defects in Copper and Ruthenium Resistors
Fleetwood, Dan; Beyne, Sofie; jiang, Rong; Zhao, S. E.; Whang, P.; Bonaldo, S.; McCurdy, M. W.; Tokei, Zsolt; De Wolf, Ingrid; Croes, Kristof; Zhang, E. X.; Alles, M. S.; Schrimpf, Ronald; Reed, Robert; Linten, Dimitri (2019)