Browsing by author "Wu, Xing"
Now showing items 1-4 of 4
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Oxygen soluble gate electrodes for prolonged high-kappa gate-stack reliability
Raghavan, Nagarajan; Pey, Kin Leong; Wu, Xing; Liu, Wenhu; Li, Xiang; Bosman, Bosman; Kauerauf, Thomas (2011) -
Physical analysis of beakdown in High-k /metal gate stacks using TEM/EELS and STM for relibaility enhancement
Pey, Kin Leong; Raghavan, Nagarajan; Wu, Xing; Liu, Wenhu; Li, Xiang; Bosman, Michel; Shubhakar, Kalya; Lwin, Zin Zar; Chen, Yining; Qin, Hailang; Kauerauf, Thomas (2011) -
Random telegraph noise reduction in metal gate high-k stacks by bipolar switching and the performance boosting technique
Liu, Wenhu; Pey, Kin Leong; Raghavan, Nagarajan; Wu, Xing; Bosman, Michel; Kauerauf, Thomas (2011) -
Very low reset current for an RRAM device achieved in the oxygen-vacancy-controlled regime
Raghavan, Nagarajan; Pey, Kin Leong; Li, Xiang; Liu, Wenhu; Wu, Xing; Bosman, Michel; Kauerauf, Thomas (2011)