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Oxygen soluble gate electrodes for prolonged high-kappa gate-stack reliability
Publication:
Oxygen soluble gate electrodes for prolonged high-kappa gate-stack reliability
Date
2011
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Raghavan, Nagarajan
;
Pey, Kin Leong
;
Wu, Xing
;
Liu, Wenhu
;
Li, Xiang
;
Bosman, Bosman
;
Kauerauf, Thomas
Journal
IEEE Electron Device Letters
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1983
since deposited on 2021-10-19
Acq. date: 2025-10-27
Citations
Metrics
Views
1983
since deposited on 2021-10-19
Acq. date: 2025-10-27
Citations