Browsing by author "Yang, Hong"
Now showing items 1-7 of 7
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A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/AC NBTI Stress/Recovery Condition in Si p-FinFETs
Zhou, Longda; Zhang, Zhaohao; Yang, Hong; Ji, Zhigang; Liu, Qianqian; Zhang, Qingzhu; Simoen, Eddy; Yin, Huaxiang; Luo, Jun; Du, Anyan; Zhao, Chao; Wang, Wenwu (2021) -
Alleviation of Negative-Bias Temperature Instability in Si p-FinFETs With ALD W Gate-Filling Metal by Annealing Process Optimization
Zhou, Longda; Liu, Qianqian; Yang, Hong; Ji, Zhigang; Xu, Hao; Wang, Guilei; Simoen, Eddy; Jiang, Haojie; Luo, Ying; Kong, Zhenzhen; Bai, Guobin; Luo, Jun; Yin, Huaxiang; Zhao, Chao; Wang, Wenwu (2021) -
Comparative study on NBTI kinetics in Si p-FinFETs with B2H6-based and SiH4-based atomic layer deposition tungsten (ALD W) filling metal
Zhou, Longda; Wang, Guilei; Yin, Xiaogen; Ji, Zhigang; Liu, Qianqian; Xu, Hao; Yang, Hong; Simoen, Eddy; Wang, Xiaolei; Ma, Xueli; Li, Yongliang; Kong, Zhenzhen; Jiang, Haojie; Luo, Ying; Yin, Huaxiang; Zhao, Chao; Wang, Wenwu (2020) -
Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs
Chang, Hao; Zhou, Longda; Yang, Hong; Ji, Zhigang; Liu, Qianqian; Simoen, Eddy; Yin, Huaxiang; Wang, Wenwu (2021) -
Comparison of DC/AC Hot Carrier Degradation between Short Channel Si Bulk and SiGe SOI p-FinFETs
Chang, Hao; Zhang, Yongkui; Zhou, Longda; Ji, Zhigang; Yang, Hong; Liu, Qianqian; Li, Yongliang; Liang, Renrong; Simoen, Eddy; Zhu, Huilong; Luo, Jun; Wang, Wenwu (2021) -
Degradation Mechanism of Short Channel p-FinFETs under Hot Carrier Stress and Constant Voltage Stress
Chang, Hao; Zhou, Longda; Yang, Hong; Ji, Zhigang; Liu, Qianqian; Xu, Hao; Simoen, Eddy; Yin, Huaxiang; Wang, Wenwu (2020) -
Impact of ALD TiN capping layer on interface trap and channel hot carrier reliability of HKMG nMOSFETs
Yang, Hong; Luo, Weichun; Zhou, Longda; Xu, Hao; Tang, Bo; Simoen, Eddy; Yin, Huaxiang; Zhu, Huilong; Zhao, Chao; Wang, Wenwu; Ye, Tianchun (2018)