Browsing by author "Kerber, M."

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Influence of stress-induced leakage current on reliability of HfSiOx

Jakschik, S.; Kauerauf, Thomas; Degraeve, Robin; Hwang, Young Nam; Duschl, R.; Kerber, M.; Avellan, A.; Kudelka, S. (2007)
Reliability screening oh high-k dielectrics based on voltage ramp stress

Kerber, A.; Pantisano, Luigi; Veloso, Anabela; Groeseneken, Guido; Kerber, M. (2007)