Browsing by author "Nguyen, B.-Y."
Now showing items 1-3 of 3
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A novel low-voltage biasing scheme for double gate FBC achieving 5s retention and 10^16 endurance at 85°C
Lu, Zhichao; Collaert, Nadine; Aoulaiche, Marc; De Wachter, Bart; De Keersgieter, An; Schwarzenbach, W.; Bonnin, O.; Bourdelle, K.K.; Nguyen, B.-Y.; Mazure, C.; Altimime, Laith; Jurczak, Gosia (2010) -
Analysis of sense margin and reliability of 1T-DRAM fabricated on thin-film UTBOX substrates
Collaert, Nadine; Aoulaiche, Marc; Rakowski, Michal; De Wachter, Bart; Bourdelle, K.; Nguyen, B.-Y.; Boedt, F.; Delprat, D.; Jurczak, Gosia (2009) -
Reliability and retention of 1T-RAM cell capacitor less on UTBOX SOI substrates
Aoulaiche, Marc; Collaert, Nadine; Simoen, Eddy; Mercha, Abdelkarim; De Wachter, Bart; Bourdelle, K.K.; Nguyen, B.-Y.; Boedt, F.; Delprat, D.; Jurczak, Gosia; Altimime, Laith (2010)