Authors

Lu, Zhichao; Collaert, Nadine; Aoulaiche, Marc; De Wachter, Bart; De Keersgieter, An; Schwarzenbach, W.; Bonnin, O.; Bourdelle, K.K.; Nguyen, B.-Y.; Mazure, C.; Altimime, Laith; Jurczak, Gosia

Conference

IEEE International Elecrton Devices Meeting - IEDM

Title

A novel low-voltage biasing scheme for double gate FBC achieving 5s retention and 10^16 endurance at 85°C

Publication type

Proceedings paper

Embargo date

9999-12-31