Browsing by author "Uemura, K."

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Degradation of SiC-MESFETs by irradiation

Ohyama, H.; Takakura, K.; Uemura, K.; Shigaki, K.; Kudou, T.; Matsumoto, T.; Arai, M.; Kuboyama, S.; Kamezawa, C.; Simoen, Eddy; Claeys, Cor (2008)
Effect of gate interface on performance degration of irradiated SiC-MESFET

Ohyama, H.; Takakura, K.; Yoneoka, M.; Uemura, K.; Motoki, M.; Matsuo, K.; Arai, M.; Kuboyama, S.; Simoen, Eddy; Claeys, Cor (2007)