Degradation of SiC-MESFETs by irradiation

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Authors

Ohyama, H.; Takakura, K.; Uemura, K.; Shigaki, K.; Kudou, T.; Matsumoto, T.; Arai, M.; Kuboyama, S.; Kamezawa, C.; Simoen, Eddy; Claeys, Cor

ISSN

0957-4522

Issue

2

Journal

Journal of Materials Science: Materials in Electronics

Volume

19

Title

Degradation of SiC-MESFETs by irradiation

Publication type

Journal article

Embargo date

9999-12-31

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