Browsing by author "Zhao, Simeng"
Now showing items 1-2 of 2
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Gate bias and length dependences of total-ionizing-dose effects in InGaAs FinFETs on bulk Si
Zhao, Simeng; jiang, Rong; Wang, Pang; Zhang, En Xia; Waldron, Niamh; Kunert, Bernadette; Mitard, Jerome; Collaert, Nadine; Soncke, Sonja; Linten, Dimitri; Schrimpf, Ronald; Reed, Robert; Fleetwood, Daniel (2018-09) -
Total-ionizing-dose effects in InGaAs MOSFETs with high-k gate dielectrics and InP substrates
Bonaldo, Stefano; Zhang, En Xia; Zhao, Simeng; Putcha, Vamsi; Parvais, Bertrand; Linten, Dimitri; Gerardin, Simone; Paccagnella, Alessandro; Reed, Robert A.; Schrimpf, Ronald D.; Fleetwood, Daniel M. (2020)