Browsing by author "Ryssel, H."
Now showing items 1-2 of 2
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Approach for a standardized methodology for multisite processing of 300-mm wafers at R&D sites
Oechsner, Richard; Pfeffer, M.; Frickinger, J.; Schellenberger, M.; Roeder, G.; Pfitzner, L.; Ryssel, H.; Fritzsche, M.; Kaushik, V.; Renaud, D.; Danel, A.; Claeys, Cor; Bearda, Twan; Lering, M.; Graef, M.; Murphy, B.; Walther, H.; Hury, S. (2007) -
The ADEQUAT project for development and transfer of 0.25µm logic complementary metal-oxide-semiconductor modules
De Keersmaecker, Roger; Declerck, Gilbert; Félix, P.; Haond, M.; Hill, C.; Janssen, G.; Lorenz, J.; Maes, Herman; Montree, Andre; Neppl, F.; Patruno, P.; Rudan, M.; Ryssel, H.; Van den hove, Luc; Vandervorst, Wilfried; van Ommen, A. (1994)