Browsing by author "Geessels, Joris"
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Compact silicon photonics circuit to extract multiple parameters for process control monitoring
Xing, Yufei; Wang, Mi; Ruocco, Alfonso; Geessels, Joris; Khan, Muhammad Umar; Bogaerts, Wim (2020-02) -
Extracting multiple parameters from a compact circuit for performance evaluation
Xing, Yufei; Wang, Mi; Ruocco, Alfonso; Geessels, Joris; Khan, Muhammad Umar; Bogaerts, Wim (2019) -
Predicting yield of photonic circuits with wafer-scale fabrication variability
Bogaerts, Wim; Xing, Yufei; Ye, Yinghao; Khan, Muhammad Umar; Dong, Yiaxing; Geessels, Joris; Fiers, Martin; Spina, Domenico; Dhaene, Tom (2019)