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Predicting yield of photonic circuits with wafer-scale fabrication variability
Publication:
Predicting yield of photonic circuits with wafer-scale fabrication variability
Date
2019
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bogaerts, Wim
;
Xing, Yufei
;
Ye, Yinghao
;
Khan, Muhammad Umar
;
Dong, Yiaxing
;
Geessels, Joris
;
Fiers, Martin
;
Spina, Domenico
;
Dhaene, Tom
Journal
Abstract
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1985
since deposited on 2021-10-27
1
last week
Acq. date: 2025-10-28
Citations
Metrics
Views
1985
since deposited on 2021-10-27
1
last week
Acq. date: 2025-10-28
Citations