Authors

Bogaerts, Wim; Xing, Yufei; Ye, Yinghao; Khan, Muhammad Umar; Dong, Yiaxing; Geessels, Joris; Fiers, Martin; Spina, Domenico; Dhaene, Tom

Conference

2019 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)

Title

Predicting yield of photonic circuits with wafer-scale fabrication variability

Publication type

Proceedings paper

Embargo date

9999-12-31