Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Predicting yield of photonic circuits with wafer-scale fabrication variability
Publication:
Predicting yield of photonic circuits with wafer-scale fabrication variability
Copy permalink
Date
2019
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
45574.pdf
1.09 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bogaerts, Wim
;
Xing, Yufei
;
Ye, Yinghao
;
Khan, Muhammad Umar
;
Dong, Yiaxing
;
Geessels, Joris
;
Fiers, Martin
;
Spina, Domenico
;
Dhaene, Tom
Journal
Abstract
Description
Metrics
Views
1989
since deposited on 2021-10-27
1
last month
1
last week
Acq. date: 2025-12-10
Citations
Metrics
Views
1989
since deposited on 2021-10-27
1
last month
1
last week
Acq. date: 2025-12-10
Citations