Browsing by author "Miura, T."
Now showing items 1-7 of 7
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Defect assessment of irradiated STI diodes
Ohyama, Hidenori; Hayama, Kiyoteru; Miura, T.; Simoen, Eddy; Claeys, Cor; Poyai, Amporn; Nakabayashi, M.; Kobayashi, K. (2001) -
Defect assessment of irradiated STI Diodes
Ohyama, Hidenori; Hayama, Kiyoteru; Miura, T.; Simoen, Eddy; Claeys, Cor; Poyai, Amporn; Nakabayashi, M.; Kobayashi, K. (2002) -
Influence of irradiation temperature on electron-irradiated STI Si diodes
Ohyama, Hidenori; Hayama, Kiyoteru; Takakura, K.; Miura, T.; Jono, T.; Simoen, Eddy; Poyai, Amporn; Claeys, Cor (2002) -
Influence of irradiation temperature on electron-irradiated STI Si diodes
Ohyama, H.; Hayama, K.; Takakura, K.; Miura, T.; Shigaki, K.; Jono, T.; Simoen, Eddy; Poyai, Amporn; Claeys, Cor (2003) -
Radiation damage in shallow trench isolation diodes
Hayama, K.; Ohyama, H.; Miura, T.; Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Kobayashi, K. (2001) -
Radiation damages in STI diodes after high temperature electron-irradiation
Ohyama, H.; Hayama, K.; Takakura, K.; Miura, T.; Simoen, Eddy; Poyai, Amporn; Takami, Y.; Claeys, Cor (2002) -
Radiation defects in Sti silicon diodes and their effects on device performance
Hayama, Kiyoteru; Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Poyai, Amporn; Miura, T.; Kobayashi, K. (2001)