Browsing by author "Deleonibus, S."

Now showing items 1-2 of 2

In-depth characterization of the hole mobility in 50-nm process-induced strained MOSFETs

Andrieu, F.; Ernst, T.; Ravit, Claire; Jurczak, Gosia; Gibaudo, G.; Deleonibus, S. (2005)
Secondary impact ionization and device aging in deep submicron MOS devices with various transistor architectures

Marchand, B.; Cretu, B.; Ghibaudo, G.; Balestra, F.; Blachier, D.; Leroux, C.; Deleonibus, S.; Guegan, G.; Reimbold, G.; Kubicek, Stefan; De Meyer, Kristin (2002)