Now showing items 1-2 of 2

    • Atomistic modeling of impurity ion implantation in ultra-thin-body Si devices 

      Pelaz, L.; Duffy, Ray; Aboy, M.; Marques, L.; Lopez, P.; Santos, I.; Pawlak, Bartek; Van Dal, Mark; Duriez, Blandine; Merelle, Thomas; Doornbos, Gerben; Collaert, Nadine; Witters, Liesbeth; Rooyackers, Rita; Vandervorst, Wilfried; Jurczak, Gosia; Kaiser, M.; Weemaes, R.; Van Berkum, J.; Breimer, P.; Lander, Rob (2008)
    • Tuning PMOS Mo(O,N) metal gates to NMOS by addition of DyO capping layer 

      Petry, Jasmine; Singanamalla, Raghunath; Xiong, K.; Ravit, C.; Simoen, Eddy; O'Connor, Robert; Veloso, Anabela; Adelmann, Christoph; Van Elshocht, Sven; Paraschiv, Vasile; Brus, Stephan; Van Berkum, J.; Kubicek, Stefan; De Meyer, Kristin; Biesemans, Serge; Hooker, Jacob (2007)