Browsing by author "Poleunis, C."

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Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors

Fleischmann, Claudia; Conard, Thierry; Havelund, R.; Franquet, Alexis; Poleunis, C.; Voroshazi, Eszter; Delcorte, A.; Vandervorst, Wilfried (2013)
ToF-SIMS and XPS characterization of plasma etch residues on cobalt silicide surfaces

Storm, Wolfgang; Vandervorst, Wilfried; Vanhaelemeersch, Serge; Baklanov, Mikhaïl; Maex, Karen; Poleunis, C.; Bertrand, P. (1997)