Browsing by author "Taur, Yuan"
Now showing items 1-4 of 4
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A unified two-band model for oxide traps and interface states in MOS capacitors
Taur, Yuan; Chen, Han-Ping; Xie, Qian; Ahn, Jaesoo; McIntyre, Paul; Lin, Dennis; Vais, Abhitosh; Veskler, Dimitri (2015) -
Determination of energy and spatial distribution of oxide border traps in In0.53Ga0.47As MOS capacitors fron capacitance-voltage characteristics measured at various temperatures
Dou, Chunmeng; Lin, Dennis; Vais, Abhitosh; Ivanov, Tsvetan; Chen, Han-Ping; Martens, Koen; Kakushima, Kuniyuki; Iwai, Hiroshi; Taur, Yuan; Thean, Aaron; Groeseneken, Guido (2014) -
On the temperature dependence of frequency dispersion in C-V measurements of III-V MOS devices and its application in spatial profiling of border traps
Vais, Abhitosh; Lin, Dennis; Dou, Chunmeng; Yuan, Yu; Martens, Koen; Ivanov, Tsvetan; Collaert, Nadine; De Meyer, Kristin; Thean, Aaron; Taur, Yuan (2013) -
What will end CMOS scaling - money or physics?
Stork, H.; Bohr, M.; Durcan, M.; Shang-Ti, Chiang; Fukuma, M.; Declerck, Gilbert; Taur, Yuan (2004)