Browsing by author "Palumbo, Felix"
Now showing items 1-4 of 4
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Defect spectroscopy from electrical measurements: a simulation based technique
Larcher, Luca; Padovani, Andrea; Pramanik, Dipankar; Kaczer, Ben; Palumbo, Felix (2018) -
Hf-based high-k dielectrics for p-Ge MOS gate stacks
Fadida, Sivan; Palumbo, Felix; Nyns, Laura; Lin, Dennis; Van Elshocht, Sven; Caymax, Matty; Eizenberg, Moshe (2014) -
Standards for the Characterization of Endurance in Resistive Switching Devices
Lanza, Mario; Waser, Rainer; Ielmini, Daniele; Yang, J. Joshua; Goux, Ludovic; Sune, Jordi; Kenyon, Anthony Joseph; Mehonic, Adnan; Spiga, Sabina; Rana, Vikas; Wiefels, Stefan; Menzel, Stephan; Valov, Ilia; Villena, Marco A.; Miranda, Enrique; Jing, Xu; Campabadal, Francesca; Gonzalez, Mireia B.; Aguirre, Fernando; Palumbo, Felix; Zhu, Kaichen; Roldan, Juan Bautista; Puglisi, Francesco Maria; Larcher, Luca; Hou, Tuo-Hung; Prodromakis, Themis; Yang, Yuchao; Huang, Peng; Wan, Tianqing; Chai, Yang; Pey, Kin Leong; Raghavan, Nagarajan; Duenas, Salvador; Wang, Tao; Xia, Qiangfei; Pazos, Sebastian (2021) -
Temperature of Conductive Nanofilaments in Hexagonal Boron Nitride Based Memristors Showing Threshold Resistive Switching
Lanza, Mario; Palumbo, Felix; Shi, Yuanyuan; Aguirre, Fernando; Boyeras, Santiago; Yuan, Bin; Yalon, Eilam; Moreno, Enrique; Wu, Tianru; Roldan, Juan B. (2022)