Defect spectroscopy from electrical measurements: a simulation based technique

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Authors
Larcher, Luca; Padovani, Andrea; Pramanik, Dipankar; Kaczer, Ben; Palumbo, Felix
Conference
2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference - EDTM
Title
Defect spectroscopy from electrical measurements: a simulation based technique
Publication type
Proceedings paper
Embargo date
9999-12-31
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