Publication:

Defect spectroscopy from electrical measurements: a simulation based technique

Date

2018
Proceedings Paper
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dc.contributor.authorLarcher, Luca
dc.contributor.authorPadovani, Andrea
dc.contributor.authorPramanik, Dipankar
dc.contributor.authorKaczer, Ben
dc.contributor.authorPalumbo, Felix
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-25T21:31:34Z
dc.date.available2021-10-25T21:31:34Z
dc.date.embargo9999-12-31
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31118
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8421450
dc.source.beginpage145
dc.source.conference2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference - EDTM
dc.source.conferencedate13/03/2018
dc.source.conferencelocationKobe Japan
dc.source.endpage147
dc.title

Defect spectroscopy from electrical measurements: a simulation based technique

dc.typeProceedings paper
dspace.entity.typePublication
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