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Defect spectroscopy from electrical measurements: a simulation based technique
Publication:
Defect spectroscopy from electrical measurements: a simulation based technique
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Date
2018
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Larcher, Luca
;
Padovani, Andrea
;
Pramanik, Dipankar
;
Kaczer, Ben
;
Palumbo, Felix
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1959
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Acq. date: 2026-01-11
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Views
1959
since deposited on 2021-10-25
1
last month
1
last week
Acq. date: 2026-01-11
Citations