Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Defect spectroscopy from electrical measurements: a simulation based technique
Publication:
Defect spectroscopy from electrical measurements: a simulation based technique
Copy permalink
Date
2018
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
40702.pdf
389.19 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Larcher, Luca
;
Padovani, Andrea
;
Pramanik, Dipankar
;
Kaczer, Ben
;
Palumbo, Felix
Journal
Abstract
Description
Metrics
Views
1958
since deposited on 2021-10-25
Acq. date: 2025-12-10
Citations
Metrics
Views
1958
since deposited on 2021-10-25
Acq. date: 2025-12-10
Citations