Browsing by author "Cross, A."
Now showing items 1-4 of 4
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Assessment of light source bandwidth impacts on image contrast enhancement using process window discovery
Alagna, Paolo; Rechtsteiner, G.; Conley, W.; Cross, A.; Sah, K.; Halder, Sandip (2017) -
Defect learning methodology applied to microbump process at 20μm pitch and below
Liebens, Maarten; Slabbekoorn, John; Miller, Andy; Beyne, Eric; Stoerring, M.; Hiebert, S.; Cross, A. (2018) -
Massive metrology for process development and monitoring applications
Sah, Kaushik; Das, Sayantan; Li, S.; Beral, C.; Cross, A.; Halder, Sandip (2020) -
What's in space – Exploration and improvement of line/space defect inspection of fine-pitch redistribution layer for fan-out wafer level packaging
Liebens, Maarten; Slabbekoorn, John; Miller, Andy; Beyne, Eric; Yeoh, Richard; Krah, T.; Vangal, A.; Hiebert, S.; Cross, A. (2019)