Publication:

Defect learning methodology applied to microbump process at 20μm pitch and below

Date

2018

Proceedings Paper

Simple item page Full metadata Statistics

Files

43242.pdf 1.59 MB

Author(s)

Liebens, Maarten

;

Slabbekoorn, John

;

;

;

;

;

Statistics

1927 since deposited on 2021-10-25

1last month

Acq. date: 2026-08-09