Publication:

Defect learning methodology applied to microbump process at 20μm pitch and below

Date

2018

Proceedings Paper

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Files

43242.pdf 1.59 MB

Author(s)

Liebens, Maarten

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Slabbekoorn, John

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Metrics

1924 since deposited on 2021-10-25

1last month

Acq. date: 2025-12-12