Browsing by author "Aguilera, L."

Now showing items 1-2 of 2

Comparison of standard macroscopic and conductive atomic force microscopy leakage measurements on gate removed high-k capacitors

Polspoel, Wouter; Vandervorst, Wilfried; Aguilera, L.; Porti, M.; Nafria, M.; Aymerich, X. (2009)
Nanoscale electrical characterization of HfO2/SiO2/MOS gate stackx with enhanced-CAFM

Nafria, M.; Blasco, X.; Porti, M.; Aguilera, L.; Aymerich, X.; Petry, Jasmine; Vandervorst, Wilfried (2005)