Browsing by author "Robinson, Colin"
Now showing items 1-3 of 3
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Electron trapping in HfAI0 high-k stack for Flash memory applications: an origin of Vth window closure during cyclling operations
Zheng, X.F.; Robinson, Colin; Zhang, W.D.; Zhang, Jian Fu; Govoreanu, Bogdan; Van Houdt, Jan (2011-05) -
Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations
Tang, Baojun; Zhang, Weidong; Breuil, Laurent; Robinson, Colin; Wang, Yunqi; Toledano Luque, Maria; Van den Bosch, Geert; Zhang, Jianfu; Van Houdt, Jan (2014) -
Read and pass disturbance in the programmed states of floating gate Flash memory cells with high- $j inter-poly gate dielectric stacks
Tang, Baojun; Robinson, Colin; Zhang, Weidong; Zhang, Fujian; Degraeve, Robin; Blomme, Pieter; Toledano Luque, Maria; Van den Bosch, Geert; Govoreanu, Bogdan; Van Houdt, Jan (2013-07)