Authors

Tang, Baojun; Robinson, Colin; Zhang, Weidong; Zhang, Fujian; Degraeve, Robin; Blomme, Pieter; Toledano Luque, Maria; Van den Bosch, Geert; Govoreanu, Bogdan; Van Houdt, Jan

ISSN

0018-9383

Issue

7

Journal

IEEE Transactions on Electron Devices

Volume

60

Title

Read and pass disturbance in the programmed states of floating gate Flash memory cells with high- $j inter-poly gate dielectric stacks

Publication type

Journal article