Authors

Zheng, X.F.; Robinson, Colin; Zhang, W.D.; Zhang, Jian Fu; Govoreanu, Bogdan; Van Houdt, Jan

ISSN

0018-9383

Issue

5

Journal

IEEE Transactions on Electron Devices

Volume

58

Title

Electron trapping in HfAI0 high-k stack for Flash memory applications: an origin of Vth window closure during cyclling operations

Publication type

Journal article

Embargo date

9999-12-31