Browsing by author "Alvarez, David"
Now showing items 21-31 of 31
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Scanning spreading resistance microscopy for the characterization of advanced silicon devices
Alvarez, David (2007-01) -
Scanning spreading resistance microscopy of fully depleted silicon-on-insulator devices
Alvarez, David; Hartwich, J.; Kretz, J.; Fouchier, Marc; Vandervorst, Wilfried (2003) -
Scanning spreading resistance microscopy of fully depleted SOI devices
Alvarez, David; Hartwich, J.; Kretz, J.; Fouchier, Marc (2002) -
Sub-nanometer resolution dopant profiling in Si and Ge-based nanoscale devices
Vandervorst, Wilfried; Eyben, Pierre; Alvarez, David; Fouchier, Marc (2004) -
Towards a model for the electrical contact and the sample surface for scanning spreading resistance microscopy
Eyben, Pierre; Denis, S.; Clarysse, Trudo; Alvarez, David; Vandervorst, Wilfried (2003) -
Two dimensional carrier profiling using scanning capacitance microscopy
Duhayon, Natasja; Clarysse, Trudo; Alvarez, David; Eyben, Pierre; Fouchier, Marc; Vandervorst, Wilfried; Hellemans, L. (2003) -
Two dimensional carrier profiling with scanning capacitance microscopy
Duhayon, Natasja; Eyben, Pierre; Xu, Mingwei; Fouchier, Marc; Alvarez, David; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L. (2002) -
Two-dimensional carrier profiling in advanced devices with pico-meter resolution
Vandervorst, Wilfried; Alvarez, David; Eyben, Pierre; Fouchier, Marc; Hartwich, J.; Slesazech, S.; Verheyen, Peter; Hogg, S. (2004) -
Two-dimensional carrier profiling using scanning probe microscopy
Alvarez, David; Duhayon, Natasja; Eyben, Pierre; Fouchier, Marc; Xu, Mingwei; Vandervorst, Wilfried (2002) -
Two-dimensional carrier profiling with scanning probes
Vandervorst, Wilfried; Eyben, Pierre; Alvarez, David; Duhayon, Natasja; Xu, Mingwei; Clarysse, Trudo (2002) -
Two-dimensional dopant profiling using scanning probe microscopy
Duhayon, Natasja; Eyben, Pierre; Xu, Mingwei; Fouchier, Marc; Alvarez, David; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L. (2002)