Browsing by author "Bauwens, F."

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A comprehensive model for hot carrier degradation in LDMOS transistors

Moens, P.; Mertens, Jan; Bauwens, F.; Joris, P.; De Ceuninck, Ward; Tack, M. (2007)
Stress-induced mobility enhancement for integrated power transistors

Moens, Paul; Roig, J.; Clemente, Francesca; De Wolf, Ingrid; Desoete, B.; Bauwens, F.; Tack, M. (2007)